Services offered by QAV Group
- Burn in for semicon, modules and system level
- PCB design and fabrication
- Pilot run of prototype
- Automotive parts testing
- Test system customization and development
- Failure Analysis with 3D CT Xray
- Electronic Cooling with
- Quality Assurance Verification
- Design Verification on Semicon
- CSAM
- FESEM
- XRAY-3D- by 2019 Dec
- Cross section
- Ionic Contamination
- FTIR
- Ion Chromatography
- High Accelerated Life Testing (HALT)
- Highly Accelerated Stress Screening (HASS)
- Characterization Test
- Xenon test
- Carbon arc test
- Sunshine test
- Power/Thermal Cycling Test
- Design Marginality Test
- Humidity Test
- Thermal Shock Test
- HASS screen development
- Prototype testing, component level testing
- Failure analysis and repair
- Salt Spray testing
- Life testing(long hour burn-in)/ELFR
- High Potential testing
- SEM
- Reflow and pre-con for MSL tests
- Solderability Test
- MTBF
- Production Burn-in
- Coplanity Check
- Tensile Check
- Push/Pull check
- Functional Test
- X-Ray
- Mechanical Shock
- Vibration
- ISTA transportation test
- Ionic Contamination
- HAST/uHAST
- Thermal shock
- Temperature cycling
- Temperature storage
- RTOL
- HTOL
- LTOL
- SIR
- Reflow simulation
- Pick and place
- Vaccum test
- Autoclave
- Tensile Test
- Compression Test
- Abrasion Test
- Color testing
- Glossness testing
- Mechanical Free Fall- Tumbler Test
- Viscosity Test
- ESD Test
- Latchup
- H2S Gas testing
- SO2 Gas testing
- Power Quality Test
- Transient Test
- Surge Test
- Power Magnetic Test
- Load dump
- Road vehicle electrical disturbance
- Road vehicles electrical loading
- SAE 575
- Conducted Emission
- IES LM79 testing
- IES LM80 Lumens maintenance
- IP Testing
- Luminaire safety testing
- Luminaire performance testing
Using fully or partially of the followings standard
- MIL-STD-202G, Test Method Standard, Electronic & Electrical Component Parts
- Methods: 101D, 103B, 105C, 106F, 107G, 201A, 203C, 204D, 211A, 212A, 213B, 214A
- MIL-STD-781D, Reliability Testing for Engineering Development, Qualification & Production
- MIL-STD-810G, Environmental Test Methods and Engineering Guidelines
- Methods: 500.5, 501.5, 502.5, 503.5, 505.5, 506.5, 507.5, 509.5, 510.5, 513.6, 514.6, 516.6, 520.3
- MIL-STD-883H, Test Method Standard, Microcircuits
- Methods: 1001, 1004.7, 1009.8, 1010.8, 1011.9, 2001.3, 2002.5, 2004.6, 2005.2, 2007.3, 2018.5
- UN38.3 Transportation Test
- IPC TM 650 Series Moisture Testing
- IEC 68000-2-1,2-2,2-6, 2-14 ,2-27, 2-30, 2-32, 2-43, 2-60, 2-64,2-67, 2-78 Standard Basic Environmental Test
- JIS C0092, H8620 Standard Basic Environmental Test
- JESD22-A101D, A103E, A104E, A105C, A106B, A108D, A119A, A110E, A102E , 201A
- IEC 61000 series 4-2, 4-4, 4-5, 4-9, 4-10, 4-11 EMC Compliance
- ISTA 1A,2A, 3A Transportation Test
- ANSI C136.31 Transportation Test
- IEC 60529 - IPcode
- ASTM B117 Standards Method of Salt Spray (Fog) Testing
- AEC Q005, Q100, Q101, Q102, Q200B Automotive Electronic Component Test
- SAE 400, 455, 575 series Automotive Electronic Component Test
- MIL-STD-883G/202F
- Component testing and reliability confirmation eg capacitors, resistors and etc
- IEC 68000-1
- Climatic testing for electronic product eg from cold -55C to hot temperature of 150C
- IEC 68000-2
- Vibration and transportation testing for electronic product
- IEC 61000-4
- IES NA LM79-2008
- Photometric test for LED module and luminaires
- IES NA LM80-2008
- Performance test for LED Modules and Luminaires
- LED Performance and Safety Test
- IEC/PAS 62612 (Edition1.0 2009-06)
- IEC 62560 (2011)
- IEC 60838-2-2 (2008 )
- IEC 60598-1 (2006 )
- IEC 62031 (Edition 1.0 2008-01)
- IEC 61347-2-13 (1st Edition 2006-05)
- IEC/PAS 62722-2-1 (2011)
- IEC/PAS 62722-1 (2011)
- IEC 61347-1 (2003)
- IEC/PAS 62717 (2011)
- IEC 62384 (1st Edition 2006-08)